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JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working Made in Japan This TEL

SKU: 98318621230
4.7
USD1255.10 USD1304.10

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Description

Made in Japan This TEL Tokyo Electron ES3D10-201275-V1 Etch System Shutter Assembly 1

Reseller Lot of 2 This ASM Advanced Semiconductor Materials 1005-674-01 Coated Transport Tube B Lot of 2 is new surplus

Inventory # AA-892

Part No: 0020-04277

JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working Made in Japan This TELJEOL Inspection Stage Chamber Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1322 Part No: Inspection Stage Chamber Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System Installed Components Copal Electronics Part No: PS83 102V Keyence Part No: FS V31 Koganei Part No: JDAS12x5 74W Omron Part No: E3X A11 Oriental Motor Part No: PX535MH B, VEXTA SMC Part No: CDRQB20 01 476 This JEOL

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